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5082-3188 Datasheet PDF

5082-3188
HP

Part Number 5082-3188
Description PIN Diodes
Page 2 Pages
5082-3188 datasheet pdf
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PIN Diodes
Reliability Data
1N5767
5082-3080
5082-3188
Description
For applications requiring
component reliability estimation,
Hewlett-Packard provides
reliability data for all families of
devices. Data is initially compiled
from reliability tests run prior to
market introduction to demon-
strate that a product meets
design criteria. Additional tests
are run periodically. The data on
this sheet represents the latest
review of accumulated test
results.
400
350
300
Applications
This information represents the
capabilities of the generic device.
Failure rates and MTTF values
presented here are achievable
with normal MIL-S-19500 TX level
screening. This reliability screen-
ing is no longer available from
Hewlett-Packard. The screening
tests, references, conditions, lot
sizes, and LTPD are provided as
references only.
250
200
150
EA = 1.3 eV
100
50
25
102
103 104 105 106 107
MEAN TIME TO FAILURE, MTTF (HRS)
108
Mean Time to Failure vs. Junction Temperature
2-109
109
5966-0946E

















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5082-3188 datasheet pdf
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5082-3188 pdf
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